LayTec plugin improvements

[aalbino2]

• develop a LayTec Epitt Experiment schema to handle multiple in-situ measurements of a MOVPE process
• sample: later also reference to specific position on sample(wafer), e.g. center, edge --> from runtype settings
• add the post processing to clean from the noise (pick @ThomasTSC code)
• add the post processing to simulate the curve from a phenomenological optical model (to be done as soon as @ThomasTSC will refine his code)

Originally posted by @aalbino2 in #65 (comment)

[aalbino2]

• which wavelength should be shown in overview
• the typical filename "210225_032_TEOS_18_azimuth179_Ring TT1_Head1_Ga Zone 1 (Center)_001.dat" contains some metadata. How can we pick them and add to the schema?

[aalbino2]

• we miss in the laytec file a reference to which sample is actually measured (there is only the element in the filename). Can we organize better the info in WAFER_LABEL, RUN_ID, RUNTYPE_NAME for upcoming measurements?
• should it be shown in the experiment or in the growth_run? (I think in the growth run)

Side note: I need to link the process in the measurement like the following

201201_208_TEOS.archive.yaml#data/growth_runs/0