Smartest 8.2.5.x Basic Training.md

V93000 SmarTest 8 Basic User Training

==Version 8.2.5==

[TOC]

Introduction/Agenda

Lecture 01: Introduction, Concepts and Software overview

• ==Key Objectives of SmarTest 8==
  1. Enable the shortest time from tape-out to volume production.
  2. Enable best test program development efficiency.
  3. Offer the fastest test throughput for manufacturing test of complex SOC/SiP/TSV and also small low complexity devices.

• ==SmarTest 8 Values==

  1. Simple synchronization across domains

  2. Unified setups and tools

     Hardware Abstraction: awg, clock, dcVI, digInout...

     Multi Domain Tools: Timing Debug, digital/analog/RF/DC/PA...

  3. Reuse

     Every node of a testflow can be a test suite or another testflow.

     Every testflow can have input and output parameters.

  4. Collaborative development

     • Flexible file structure for setup files • Allows a dedicated file for a setup entity • Integrated support for SVN and GIT • Links to external setup files

  5. Assisted setup generation

     SmarTest Setup Format (SSF)

     快捷键：ctrl-space, F3

     视图切换：例如 pin定义

  6. Smart test methods

     单site扩展成多site容易

     支持特定site的数据处理

     结果支持后台运算

  7. Java

• graphical tools

Lecture 02: SmarTest Projects

• SmarTest 8 Project

  – Java Libraries – V93000 System Libraries – Source Folders – Configuration Files – Compile/Build Directories

• Project Setup

  1. Creat new SmarTest Project
  2. Import SmarTest Project

Lab 01: Preparation and Prerequisites

• Start SmarTest 8 with the correct model file. • Create a workspace • Change the view • Import the SmarTest 8 project (i.e. test program) used in the lab

Lecture 03: Test Program File

• ==Test Program File==

• ==DUT Board Description File==

• ==Main Flow File==

• ==Auxiliary Flow Files==

==example==


Ctrl+Space

Lecture 04: DUT Board Description File

• example


dutboard = crossconnect.common.BasicLab;

• Ganging DPS Channels

• DUT Boards with Switches

• RF Pins Setup

Lab 02: DUT Board Description

Lecture 05: Building Blocks of Test Programs

Lab 03: Test Program

Lecture 06: Testflow and Test Suites

Lab 04: Testflow

Lecture 07: Operating Sequence

Lab 05: Operating Sequence

Lecture 08: Hardware Overview*

Lecture 09: Instruments

Lecture 10: Basics Level and Timing*

Lecture 11: Specification Files - Digital Setups

Lab 06: Timing Sets and Level Sets

​

Lecture 12: Specification Files - Multi Domains

Lab 07: Timing Debug

Lecture 13: Patterns

Lab 08+09: X-Mode + Pattern Debug

Lecture 14: Actions, Patterns and Transactions

Lab 10: DC Measurement

Lecture 15: Technical Documentation Center

Lecture 16: Testflow File

Lab 11: Test Method Library*

Lecture 17: Test Methods – Introduction

Lab 12: Test Method Creation

Lecture 18: Test Methods – Basics

Lecture 19: Test Methods – Multi Site Types

Lab 13: Test Setup Modifications

Lecture 20: Test Methods – Result Access

Lab 14: Retrieving Test Results

Lecture 21: Datalogging

Lab 15: Datalogging

Lecture 22: Binning

​

Lecture 23: Usage of Test Tables

Lecture 24: Content of Test Tables

Lecture 25: Test Program Execution and Debug

Lecture 26: Internal Steps of Test Program Execution

Lecture 27: Protocol Aware – Introduction

Lab 16: Protocol Aware Setup Files*

Lecture 28: Test Methods – Programmatic Setup Generation*

Lab 17: Setup Generation in Test Methods*

Lecture 29: Test Methods – Parameters*

Lecture 30: Debug Tools

Lab 18: Debugging Measurement Setups

​

Lecture 31: Characterization Tools

Lab 19: Characterization/Shmoo*

Lecture 32: Recommended Setup Structure

Lecture 33: Utility Lines

Lecture 34: Licensing

Lecture 35: TCCT

Lecture 36: Test Program Migration Framework*

Lecture 37: Conversion of STIL files*

Open Questions

Feedback

进阶+++

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