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diff --git a/data/ANSI_C63.14-2014_REDLINE.yaml b/data/ANSI_C63.14-2014_REDLINE.yaml
@@ -781,6 +781,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.14-2009
+    docid:
+    - id: ANSI C63.14-2009
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.14-2009
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE standards
 - content: Electromagnetic compatibility

diff --git a/data/ANSI_C63.15-2010.yaml b/data/ANSI_C63.15-2010.yaml
@@ -271,6 +271,16 @@ relation:
     formattedref:
       content: ANSI C63.15-2017
       format: text/plain
+- type: obsoletedBy
+  bibitem:
+    id: ANSIC63.15-2017
+    docid:
+    - id: ANSI C63.15-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.15-2017
+      format: text/plain
 keyword:
 - content: IEEE standards
 - content: electromagnetic compatibility

diff --git a/data/ANSI_N42.34-2015.yaml b/data/ANSI_N42.34-2015.yaml
@@ -1213,6 +1213,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIN42.34-2006
+    docid:
+    - id: ANSI N42.34-2006
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI N42.34-2006
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: ANSI Standards
 - content: Gamma rays

diff --git a/data/ANSI_USEMCSC_C63.2-2023.yaml b/data/ANSI_USEMCSC_C63.2-2023.yaml
@@ -2185,6 +2185,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.2-2016
+    docid:
+    - id: ANSI C63.2-2016
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.2-2016
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.2-2016
+    docid:
+    - id: ANSI C63.2-2016
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.2-2016
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Electromagnetic interference

diff --git a/data/ANSI_USEMCSC_C63.2-2023_REDLINE.yaml b/data/ANSI_USEMCSC_C63.2-2023_REDLINE.yaml
@@ -189,6 +189,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.2-2016
+    docid:
+    - id: ANSI C63.2-2016
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.2-2016
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.2-2016
+    docid:
+    - id: ANSI C63.2-2016
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.2-2016
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: ANSI C63.2
 - content: average detection

diff --git a/data/IEEE_11073.10419-2017.yaml b/data/IEEE_11073.10419-2017.yaml
@@ -866,6 +866,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE11073.10419-2015
+    docid:
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+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 11073.10419-2015
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Medical devices

diff --git a/data/IEEE_11073.10419-2017_REDLINE.yaml b/data/IEEE_11073.10419-2017_REDLINE.yaml
@@ -902,6 +902,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE11073.10419-2015
+    docid:
+    - id: IEEE 11073.10419-2015
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 11073.10419-2015
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Medical services

diff --git a/data/IEEE_1366-2012.yaml b/data/IEEE_1366-2012.yaml
@@ -610,6 +610,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1366-2003
+    docid:
+    - id: IEEE 1366-2003
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1366-2003
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE standards
 - content: Indexes

diff --git a/data/IEEE_1366-2012_REDLINE.yaml b/data/IEEE_1366-2012_REDLINE.yaml
@@ -253,6 +253,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1366-2003
+    docid:
+    - id: IEEE 1366-2003
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1366-2003
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE standards
 - content: Power system reliability

diff --git a/data/IEEE_1636.1-2018.yaml b/data/IEEE_1636.1-2018.yaml
@@ -4257,6 +4257,125 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1636.1-2013Redline
+    docid:
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+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1636.1-2013 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1636.1-2013Redline
+    docid:
+    - id: IEEE 1636.1-2013 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1636.1-2013 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1636.1-2013Redline
+    docid:
+    - id: IEEE 1636.1-2013 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1636.1-2013 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
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+    id: IEEE1636.1-2013Redline
+    docid:
+    - id: IEEE 1636.1-2013 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1636.1-2013 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1636.1-2013Redline
+    docid:
+    - id: IEEE 1636.1-2013 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1636.1-2013 Redline
+      format: text/plain
+  description:
+    content: revises
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+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
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+    id: IEEE1636.1-2013Redline
+    docid:
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+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1636.1-2013 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1636.1-2013Redline
+    docid:
+    - id: IEEE 1636.1-2013 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1636.1-2013 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Software maintenance