STXS_Unc

Sample notebooks to compute STXS bins uncertainties for both Stages 1.1 and 1.2. The uncertainties are computed following the scheme presented here. In each STXS bin the inclusive yield is computed, as well as the yield corresponding to mutual variations of the renormalization and factorization scales (mu_R and mu_F respectively).

STXS 1.1

The bins ID used follows the cmssw reccomandation:

stxs_binName = {
      100: GG2H_FWDH,
      101: GG2H_PTH_GT200,
      102: GG2H_0J_PTH_0_10  ,
      103: GG2H_0J_PTH_GT10  ,
      104: GG2H_1J_PTH_0_60,
      105: GG2H_1J_PTH_60_120,
      106: GG2H_1J_PTH_120_200,
      107: GG2H_GE2J_MJJ_0_350_PTH_0_60,
      108: GG2H_GE2J_MJJ_0_350_PTH_60_120,
      109: GG2H_GE2J_MJJ_0_350_PTH_120_200,
      110: GG2H_MJJ_350_700_PTHJJ_0_25,
      111: GG2H_MJJ_350_700_PTHJJ_GT25,
      112: GG2H_MJJ_GT700_PTHJJ_0_25,
      113: GG2H_MJJ_GT700_PTHJJ_GT25,
}

Plot for all relevant scale variations:

STXS 1.2

The bins ID used follows the cmssw reccomandation:

stxs_binName = {
      100: 'GG2H_FWDH',
      101: 'GG2H_PTH_200_300',
      102: 'GG2H_PTH_300_450',
      103: 'GG2H_PTH_450_650',
      104: 'GG2H_PTH_GT650',
      105: 'GG2H_0J_PTH_0_10', 
      106: 'GG2H_0J_PTH_GT10', 
      107: 'GG2H_1J_PTH_0_60',
      108: 'GG2H_1J_PTH_60_120',
      109: 'GG2H_1J_PTH_120_200',
      110: 'GG2H_GE2J_MJJ_0_350_PTH_0_60',
      111: 'GG2H_GE2J_MJJ_0_350_PTH_60_120',
      112: 'GG2H_GE2J_MJJ_0_350_PTH_120_200',
      113: 'GG2H_GE2J_MJJ_350_700_PTH_0_200_PTHJJ_0_25',
      114: 'GG2H_GE2J_MJJ_350_700_PTH_0_200_PTHJJ_GT25',
      115: 'GG2H_GE2J_MJJ_GT700_PTH_0_200_PTHJJ_0_25',
      116: 'GG2H_GE2J_MJJ_GT700_PTH_0_200_PTHJJ_GT25'
}

Plot for all relevant scale variations: