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Fairmat 2024: proposal on atom probe microscopy (APM) #1422
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Application definition for XPS
…or_circuits Cleaned the too many base classes for circuits and cleaned base classes for describing a computer
Make geometries and sourceTYPE recommended in NXxps
change docs in NXcollectioncolumn
…ses by definitions in appdefs
…NXms with NXmicrostructure to avoid confusing the symbol convention with mass spectrometry as the abbreviation NXms may suggest
…con and eventually make this NXmicrostructure
Co-authored-by: Florian Dobener <[email protected]>
… contributed but implicitly as a dependency of NXem, NXem_ebsd, NXem_img proposed for voting and acceptance
black formatting isort dev_tools
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…as proposed for the NOMAD apm_app on FAIRmat's nexus_definitions cc3dc40
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Refactored version for NXapm including feedback from the atom probe microscopy/field-ion microscopy community.
This PR depends heavily on others that make changes to existing base classes or introduce base classes that are to be used outside of APM as well. Thus, it will be much smaller once the discussion on these PRs is done and this particular branch here has been rebased:
#1407
#1408
#1410
#1412
#1413
#1414
#1415
#1419
#1420
#1486
There are however several new base classes that are currently only used within NXapm that are introduced here:
Aim and design of the appdef is as follows:
NXapm envisaged to be used for documenting measurement and computer simulation of field evaporation experiment.
Instrument part split in two parts:
This idea allows to not always repeat like with which instrument and hardware components the events were collected
In field evaporation experiment one measures:
Contrary to the previous version of this proposal:
Points of discussion from my side @mkuehbach:
detectors in event mode."
Note that in FAIRmat we have a comprehensive set of appdefs built around NXapm which we currently do not propose for standardization but it is worthwhile to mention as these explore in many examples the usage of #1421