tests: benchmarks: power_consumption: flash: extend test with writes

Add erase and write operation.
Validate read values.

Signed-off-by: Piotr Kosycarz <[email protected]>

tests/benchmarks/power_consumption/flash/src/driver_test.c

@@ -17,22 +17,31 @@
 #define FLASH_NODE DT_INVALID_NODE
 #endif
 
-#define TEST_AREA_OFFSET	0xff000
-#define EXPECTED_SIZE	512
+#define TEST_AREA_OFFSET 0xff000
+#define EXPECTED_SIZE	 512
+#define FLASH_PAGE_SIZE	 4096
+
 uint8_t buf[EXPECTED_SIZE];
 
 static const struct device *flash_dev = DEVICE_DT_GET(FLASH_NODE);
 
-
 void thread_definition(void)
 {
-	int ret;
+	int rc;
+	uint8_t fill_value = 0x00;
 
 	while (1) {
-		ret = flash_read(flash_dev, TEST_AREA_OFFSET, buf, EXPECTED_SIZE);
-		if (ret < 0) {
-			printk("Failure in reading byte %d", ret);
-			return;
+		rc = flash_erase(flash_dev, TEST_AREA_OFFSET, FLASH_PAGE_SIZE);
+		__ASSERT(rc == 0, "flash_erase %d\n", rc);
+		rc = flash_fill(flash_dev, fill_value, TEST_AREA_OFFSET, EXPECTED_SIZE);
+		__ASSERT(rc == 0, "flash_fill %d\n", rc);
+		rc = flash_read(flash_dev, TEST_AREA_OFFSET, buf, EXPECTED_SIZE);
+		__ASSERT(rc == 0, "flash_read %d\n", rc);
+		for (size_t i = 0; i < EXPECTED_SIZE; i++) {
+			__ASSERT(buf[i] == fill_value, "flash value %d but expected %d\n", buf[i],
+				 fill_value);
+			buf[i] = (uint8_t)i;
 		}
+		fill_value++;
 	};
 };