-
Notifications
You must be signed in to change notification settings - Fork 2.1k
New issue
Have a question about this project? Sign up for a free GitHub account to open an issue and contact its maintainers and the community.
By clicking “Sign up for GitHub”, you agree to our terms of service and privacy statement. We’ll occasionally send you account related emails.
Already on GitHub? Sign in to your account
Changed times and hue steps in TC-CC-3.3 so tolerance does not span wrap #37308
base: master
Are you sure you want to change the base?
Conversation
Changed Files
|
PR #37308: Size comparison from e80451c to 962fd93 Full report (71 builds for bl602, bl702, bl702l, cc13x4_26x4, cc32xx, cyw30739, efr32, esp32, linux, nrfconnect, nxp, psoc6, qpg, stm32, telink, tizen)
|
There was a problem hiding this comment.
Choose a reason for hiding this comment
The reason will be displayed to describe this comment to others. Learn more.
LGTM however we should wait on the dependency in https://github.com/CHIP-Specifications/chip-test-plans/pull/4933 to merge first.
There was a problem hiding this comment.
Choose a reason for hiding this comment
The reason will be displayed to describe this comment to others. Learn more.
Can you please go through and double check these numbers against the test plan? Some of them are off.
This PR updates TC-CC-3.3.yaml file. This PR is linked to Fixes #475. The [PR #35525] was used as guidance.
It also includes changes in test specifications that were done in PR 4993.
Updates:
Testing:
To not skip test steps CC.S.F00 needs to be 1. Changed this value in src/app/tests/suites/certification/ci-pics-values.
In the first terminal:
rm /tmp/chip_*
In the second terminal:
In the third terminal: