Tutorial

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Application of Logistic Regression on Atomic Force Microscopy (AFM) Data to classify surface contact

This is a tutorial showing an example of applying logistic regression on AFM dynamic amplitude vs sample position curves to classify them into two categories based on whether the AFM tip has made contact with the material surface or not.

Basic Information

The source code for this tutorial has been posted on GitHub. The tutorial uses Juypter Notebook for publishing its documentation.

Prerequisites

1. Python 3.0 +
2. matplotlib
3. numpy
4. pandas
5. scikit-learn
6. scipy
7. https://pypi.org/project/igor/

How to use this Tutorial

1. Make sure you have all the required pre-requisities.
2. Download the code file from GitHub on your PC
3. Read through the code and understand the working of each function. Proper documentation is given to for a detailed explanation.
4. Run the code and review the results.

Contributing

Please feel free to contribute ideas to further improve this tutorial. You are free suggest changes and improvements.

Authors

Arjun Gupta ([email protected]) Ryan B Wagner ([email protected])